Fibics Incorporated

Offering FIB oriented solutions

Our goal is developing applications using a Focused Ion Beam (FIB) microscopy in the fields of metallurgy, materials sciences and semiconductor industry.  Since acquiring its first FIB in 1997, Fibics has developed an international reputation for its work in both metallurgy/materials science and semiconductor device modification (microsurgery) as well as in TEM specimen preparation, “nanomachining” and analysis.

Applications

Have a look at what a FIB can do

FIB/SEM Image Gallery

All the weird and wonderful world of FIB/SEM Imaging

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