Below, a "traditional" TEM sample in the midst of fabrication is shown at a tilt of forty-five degrees. This kind of sample is made from a bar of material and, as a result, requires extensive thinning before an electron transparent membrane can be arrived at. Another option for electron microscopy and analysis is the "lift-out" method , which has the added advantage of being faster since it requires no extensive pre-thinning and continues to retain site specificity.