Fibics Pattern
 home  |  about us  |  contact us  |  find us   
FIB
  • FIB for Semiconductor Applications
  • Device Modification (Microsurgery)
  • Probe Pad & Window Creation
  • Parallel Lapping
  • TEM Specimen Preparation
    • TEM
  • TEM for Semiconductor Applications
    • SIMS
  • SIMS for Semiconductor Applications
  • Application Examples
  • Additional Analytical Services
    • Application Examples
    Many different techniques are available to Fibics when it comes to materials analysis. The following links lead to some examples of the many possible types of analysis techniques available through Fibics:
     home  |  about us  |  contact us  |  find us